Carrier recombination dynamics in InGaN/GaN multiple quantum wells
arXiv:1004.2463 · doi:10.1103/PhysRevB.82.085305
Abstract
We have mesured the carrier recombination dynamics in InGaN/GaN multiple quantum wells over an unprecedented range in intensity. We find that at times shorter than 30\,ns, they follow an exponential form, and a power law at times longer than 1\,s. To explain these biphasic dynamics, we propose a simple three-level model where a charge-separated state interplays with the radiative state through charge transfer following a tunneling mechanism. We show how the distribution of distances in charge-separated states controls the dynamics at long time. Our results imply that charge recombination happens on nearly-isolated clusters of localization centers.
11 pages, 3 figures, accepted for publication in PHYSICAL REVIEW B
References in corpus (1)
Cited by in corpus (10)
- Charge separation by photoexcitation in semicrystalline polymeric semiconductors: An intrinsic or extrinsic mechanism?
- Structural, electronic, and optical properties of -plane InGaN/GaN quantum wells: Insights from experiment and atomistic theory
- Coexistence of quantum-confined Stark effect and localized states in an (In,Ga)N/GaN nanowire heterostructure
- Radial Stark effect in (In,Ga)N nanowires
- Temperature-dependent steady and transient emission properties of InGaN/GaN multiple quantum well nanorods
- Ga-polar (In,Ga)N/GaN quantum wells vs. N-polar (In,Ga)N quantum disks in GaN nanowires: Comparative analysis of carrier recombination, diffusion, and radiative efficiency
- Individual electron and hole localization in submonolayer InN quantum sheets embedded in GaN
- Nonexponential photoluminescence dynamics in an inhomogeneous ensemble of excitons in WSe monolayers
- Observation of lattice waves through observation of the photoluminescence Blinking in InGaN Quantum Well devices
- Analysis of Emission Dynamics of a Long Lifetime in Single InAs/GaAs Quantum Dots