paper

Resonant escape over an oscillating barrier in single-electron ratchet transfer

arXiv:1002.2422 · doi:10.1103/PhysRevB.82.033303

Abstract

Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.

4 pages, 5 figures

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