Galvanomagnetic properties and noise in a barely metallic film of V2O3

Abstract

We have measured the magnetotransport properties of a strained metallic V2O3 thin film. Most of the properties are similar to V2O3 single crystals that have been submitted to a large pressure. In addition, resistance noise analysis indicates that conductivity fluctuations are freezing out at T\approx 10K. Examination of a range of measurements leads to the conclusion that spins-configuration fluctuations dominate in the low temperature regime.

accepted for publication in Phys Rev B

References in corpus (4)

• Saturation of electrical resistivity
• Thickness-dependence of the electronic properties in V2O3 thin films
• Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films
• Hysteresis in the electronic transport of V2O3 thin films: non-exponential kinetics and range scale of phase coexistence