Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides

Abstract

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi${}_2$CuO${}_4$, CuGeO${}_3$, Sr${}_2$Cu${}_3$O${}_4$Cl${}_2$, La${}_2$CuO${}_4$, and Sr${}_2$CuO${}_2$Cl${}_2$, and analyzed by considering both incident and scattered photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi${}_2$CuO${}_4$ and CuGeO${}_3$.

5 pages, 3 figures

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• Uncovering selective excitations using the resonant profile of indirect inelastic x-ray scattering in correlated materials: Observing two-magnon scattering and relation to the dynamical structure factor
• Polarization-analyzed resonant inelastic x-ray scattering of the orbital excitations in KCuF3
• Electronic Structure of Doped Lanthanum Cuprates Studied with Resonant Inelastic X-Ray Scattering
• Charge-transfer and Mott-Hubbard Excitations in FeBO3: Fe K edge Resonant Inelastic X-ray Scattering Study
• Momentum dependence in K-edge resonant inelastic x-ray scattering and its application to screening dynamics in CE-phase La${}_{0.5}$Sr${}_{1.5}$MnO${}_4$