Contribution of drifting carriers to the Casimir-Lifshitz and Casimir-Polder interactions with semiconductor materials
arXiv:0805.1676 · doi:10.1103/PhysRevLett.101.163203
Abstract
We develop a new theory for Casimir-Lifshitz and Casimir-Polder interactions with semiconductor surfaces that takes into account charge drift in the bulk material. The corresponding frequency-dependent dispersion relations describe a crossover between Lifshitz results for dielectrics and for good conductors. In the quasi-static limit, our calculated reflection amplitudes coincide with those recently computed to account for Debye screening in the thermal Lifshitz force with conducting surfaces with small density of carriers.
4 pages version 2: improved discussion of perfect conductor and perfect dielectric limits. Version 3; includes discussion of limits of applicability of the analysis. Version $; updated references
References in corpus (4)
Cited by in corpus (11)
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