Analysis of Incident-Photon-Energy and Polarization Dependent Resonant Inelastic X-Ray Scattering from LaCuO
arXiv:0803.1337 · doi:10.1143/JPSJ.77.034711
Abstract
We present a detailed analysis of the incident-photon-energy and polarization dependences of the resonant inelastic x-ray scattering (RIXS) spectra at the Cu edge in LaCuO. Our analysis is based on the formula developed by Nomura and Igarashi, which describes the spectra by a product of an incident-photon-dependent factor and a density-density correlation function for 3d states. We calculate the former factor using the density of states from an ab initio band structure calculation and the latter using a multiorbital tight-binding model within the Hartree-Fock approximation and the random phase approximation. We obtain spectra with rich structures in the energy-loss range 2-5 eV, which vary with varying momentum and incident-photon energy, in semi-quantitative agreement with recent experiments. We clarify the origin of such changes as a combined effect of the incident-photon-dependent factor and the density-density correlation function.
arXiv comment18 pages, 10 figures, accepted to JPSJ; Wrong e-mail address and present address removed
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- Elementary excitations probed by L-edge resonant inelastic x-ray scattering in systems with weak and intermediate electron correlations
- Resonant inelastic x-ray scattering study of the electronic structure of CuO
- Charge Excitations in Cuprate and Nickelate in Resonant Inelastic X-Ray Scattering
- Analysis of Resonant Inelastic X-Ray Scattering in Stripe-Ordered Nickelate