Dynamical scaling of $YB{a}_{2}C{u}_3{O}_{7-\delta }$ thin film conductivity in zero field

Abstract

We study dynamic fluctuation effects of $YB{a}_{2}C{u}_3{O}_{7-\delta }$ thin films in zero field around $T_c$ by doing frequency-dependent microwave conductivity measurements at different powers. The length scales probed in the experiments are varied systematically allowing us to analyze data which are not affected by the finite thickness of the films, and to observe single-parameter scaling. DC current-voltage characteristics have also been measured to independently probe fluctuations in the same samples. The combination of DC and microwave measurements allows us to precisely determine critical parameters. Our results give a dynamical scaling exponent $z=1.55\pm 0.15$, which is consistent with model E-dynamics.

4 pages and 4 figures

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Cited by in corpus (5)

• Temperature range of superconducting fluctuations above T_c in YBa_2Cu_3O_{7-δ} single crystals
• Vortex Lattice Melting and Hc2 in underdoped YBa2Cu3Oy
• A broadband microwave Corbino spectrometer at ${}^3$He temperatures and high magnetic fields
• Scaling analysis of the static and dynamic critical exponents in under, over, and optimally-doped Pr${}_{2-x}$Ce${}_x$CuO${}_{4-y}$ films
• Role of non-linear effects and standing waves in microwave spectroscopy: Corbino measurements on superconductors and VO${}_2$