Effect of epitaxial strain on ferroelectric polarization in multiferroic BiFeO3 films

Abstract

Multiferroic BiFeO3 epitaxial films with thickness ranging from 40 nm to 960 nm were grown by pulsed laser deposition on SrTiO3 (001) substrates with SrRuO3 bottom electrodes. X-ray characterization shows that the structure evolves from angularly-distorted tetragonal with c/a ~ 1.04 to more bulk-like distorted rhombohedral (c/a ~ 1.01) as the strain relaxes with increasing thickness. Despite this significant structural evolution, the ferroelectric polarization along the body diagonal of the distorted pseudo-cubic unit cells, as calculated from measurements along the normal direction, barely changes.

arXiv commentLegend in Fig.3 corrected and etc

References in corpus (4)

• Very large spontaneous electric polarization in BiFeO3 single crystals at room temperature and its evolution under cycling fields
• Effect of epitaxial strain on the spontaneous polarization of thin film ferroelectrics
• Influence of strain and oxygen vacancies on the magnetoelectric properties of multiferroic bismuth ferrite
• Suppressed dependence of polarization on epitaxial strain in highly polar ferroelectrics

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