2 papers
eess.SY2026
Tilt-based Aberration Estimation in Transmission Electron Microscopy
Jilles S. van Hulst, Erik M. Franken, Bart J. Janssen +2
Transmission electron microscopes (TEMs) enable atomic-scale imaging but suffer from aberrations caused by lens imperfections and environmental conditions, reducing image quality.…
physics.atom-ph2026
Electron Energy Loss Spectroscopy of oriented targets and magnetic transitions
Ioannis Iatrakis, Valerii Brudanin
Electron beam energies in Transmission Electron Microscopes (TEMs) reach the relativistic realm constituting Quantum Electrodynamics (QED) the appropriate framework for the study o…