2 papers
eess.SY2026
Precision Specimen Positioning in Electron Microscopy through Hysteresis Compensation, Iterative Learning, and Vision-Based Sensing
J. S. van Hulst, A. M. C. de Peffer, D. Herceg +4
Electron microscopy requires nanometer-scale specimen positioning over a long stroke. Piezo-stepper actuators are well suited for this task, but their accuracy is limited by hyster…
eess.SY2026
Tilt-based Aberration Estimation in Transmission Electron Microscopy
Jilles S. van Hulst, Erik M. Franken, Bart J. Janssen +2
Transmission electron microscopes (TEMs) enable atomic-scale imaging but suffer from aberrations caused by lens imperfections and environmental conditions, reducing image quality.…