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20052026
most citedDiscovery of a Three-dimensional Topological Dirac Semimetal, Na3Bi

2.3k citations

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9 papers · 1 filter

physics.app-ph2025

Electron Fourier ptychography for phase reconstruction

Jingjing Zhao, Chen Huang, Ali Mostaed +10

Phase reconstruction is important in transmission electron microscopy for structural studies. We describe electron Fourier ptychography and its application to phase reconstruction…

physics.app-ph2024★ 4 cited

Identifying Switching of Antiferromagnets by Spin-Orbit Torques

Martin Jourdan, Jonathan Bläßer, Guzmán Orero Gámez +9

Antiferromagnets are promising candidates for ultrafast spintronic applications, leveraging current-induced spin-orbit torques. However, experimentally distinguishing between diffe…

physics.app-ph2022★ 41 cited

Current-driven writing process in antiferromagnetic Mn2Au for memory applications

Sonka Reimers, Yaryna Lytvynenko, Yuran Niu +9

Current pulse driven Neel vector rotation in metallic antiferromagnets is one of the most promising concepts in antiferromagnetic spintronics. We show microscopically that the Neel…

physics.app-ph2021★ 170 cited

Nanoscale Chemical Heterogeneity Dominates the Optoelectronic Response over Local Electronic Disorder and Strain in Alloyed Perovskite Solar Cells

Kyle Frohna, Miguel Anaya, Stuart Macpherson +7

Halide perovskites perform remarkably in optoelectronic devices including tandem photovoltaics. However, this exceptional performance is striking given that perovskites exhibit dee…

physics.app-ph2021★ 31 cited

X-ray Ptychography with a Laboratory Source

Darren J. Batey, Frederic Van Assche, Sander Vanheule +5

X-ray ptychography has revolutionised nanoscale phase contrast imaging at large-scale synchrotron sources in recent years. We present here the first successful demonstration of the…

physics.app-ph2021★ 11 cited

Quantitative powder diffraction using a (2+3) surface diffractometer and an area detector

Giuseppe Abbondanza, Alfred Larsson, Francesco Carlá +2

X-ray diffractometers primarily designed for surface x-ray diffraction are often used to measure the diffraction from powders, textured materials, and fiber-texture samples in so-c…