67 citations
- Russian Academy of SciencesRU25 papers
- P.N. Lebedev Physical Institute of the Russian Academy of SciencesRU15 papers
- Institute for Systems AnalysisRU5 papers
- Moscow Institute of Physics and TechnologyRU3 papers
- National Research University Higher School of EconomicsRU3 papers
- Lomonosov Moscow State UniversityRU2 papers
- National Research Nuclear University MEPhIRU2 papers
- Steklov Mathematical InstituteRU2 papers
- Advanced Optical Technologies (United States)US1 paper
- Ben-Gurion University of the NegevIL1 paper
- Chinese Academy of SciencesCN1 paper
- European Organization for Nuclear ResearchCH1 paper
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cond-mat.mes-hall2017
Physics-Based Modeling of TID Induced Global Static Leakage in Different CMOS Circuits
Gennady I. Zebrev, Vasily V. Orlov, Maxim S. Gorbunov +1
Compact modeling of inter-device radiation-induced leakage underneath the gateless thick STI oxide is presented and validated taking into account CMOS technology and hardness param…
cond-mat.mes-hall2015★ 1 cited
Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach
G. I. Zebrev, K. S. Zemtsov, R. G. Useinov +3
We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets in the nanoscale (with feature sizes less than…