7.5k citations
- University of MariborSI21 papers
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Showing 2008 · cond-mat.mes-hallShow all
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cond-mat.mes-hall2008★ 606 cited
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
P. Nemes-Incze, Z. Osvath, K. Kamaras +1
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon…
cond-mat.mes-hall2008★ 962 cited
Tailoring the atomic structure of graphene nanoribbons by STM lithography
Levente Tapaszto, Gergely Dobrik, Philippe Lambin +1
The practical realization of nano-scale electronics faces two major challenges: the precise engineering of the building blocks and their assembly into functional circuits. In spite…