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Texas Instruments (United States)

United States

16 papers here2.3k citations across 16
fields
  • eess.SP3
  • cond-mat.mes-hall2
  • cs.IT2
  • cond-mat.mtrl-sci1
  • cond-mat.supr-con1
  • cs.MM1
  • cs.OH1
  • eess.SY1
ROR 03vsmv677OpenAlex

affiliations via OpenAlex

output
20022023
most citedRealization of a High Mobility Dual-gated Graphene Field Effect Transistor with Al2O3 Dielectric

1k citations

researchers with a paper here
  • L. Colombo2 · h 58
  • A. Pacheco-Sánchez1
  • Arunabha Ghosh1 · h 13
  • A. Samoletov1 · h 5
  • A. Velamakanni1 · h 17
  • A. Venugopal1 · h 10
  • Bhanu Teja Vankayalapati1
  • Bilal Akin1
  • B. Maj1 · h 4
  • Boyang Han1 · h 10
  • Carl W. Magnuson1 · h 25
  • C. Hicks1 · h 32
collaborating institutions
  • The University of Texas at AustinUS5 papers
  • The University of Texas at DallasUS3 papers
  • Stanford UniversityUS2 papers
  • AT&T (United States)US1 paper
  • Continental (Germany)DE1 paper
  • Guangdong University of TechnologyCN1 paper
  • Institut d'Électronique et des Technologies du numéRiqueFR1 paper
  • Instituto Politécnico NacionalMX1 paper
  • Intel (United States)US1 paper
  • Massachusetts Institute of TechnologyUS1 paper
  • Midé Technology (United States)US1 paper
  • Purdue University West LafayetteUS1 paper
Showing eess.SYShow all

1 paper · 1 filter

eess.SY2023★ 23 cited

AC Power Cycling Test Setup and Condition Monitoring Tools for SiC-Based Traction Inverters

Masoud Farhadi, Bhanu Teja Vankayalapati, Rahman Sajadi +1

AC power cycling tests allow the most realistic reliability assessment by applying close to real stress to the device or module under test to meet functional safety standards, whic…

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