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- Centre National de la Recherche ScientifiqueFR79 papers
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7 papers · 2 filters
Magnetic order of Dy and Fe moments in antiferromagnetic DyFeO probed by spin Hall magnetoresistance and spin Seebeck effect
G. R. Hoogeboom, T. Kuschel, G. E. W. Bauer +3
We report on spin Hall magnetoresistance (SMR) and spin Seebeck effect (SSE) in single crystal of the rare-earth antiferromagnet DyFeO with a thin Pt film contact. The angula…
Theoretical formation of carbon nanomembranes under realistic conditions using classical molecular dynamics
J. Ehrens, F. Gayk, P. Vorndamme +6
Carbon nanomembranes made from aromatic precursor molecules are free standing nanometer thin materials of macroscopic lateral dimensions. Although produced in various versions for…
Thickness-dependent electron momentum relaxation times in iron films
K. L. Krewer, W. Zhang, J. Arabski +4
Terahertz time-domain conductivity measurements in 2 to 100 nm thick iron films resolve the femtosecond time delay between applied electric fields and resulting currents. This curr…
Enhancement in Thermally Generated Spin Voltage at Pd/NiFeO Interfaces by the Growth on Lattice-Matched Substrates
A. Rastogi, Z. Li, A. V. Singh +15
Efficient spin injection from epitaxial ferrimagnetic NiFeO thin films into a Pd layer is demonstrated via spin Seebeck effect measurements in the longitudinal geometry. Th…
Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity
Jan Krieft, Dominik Graulich, Anastasiia Moskaltsova +3
X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin films. Here, we investigate s…
Effect of chemical and hydrostatic pressure on the coupled magnetostructural transition of Ni-Mn-In Heusler alloys
P. Devi, C. Salazar Mejia, L. Caron +3
Ni-Mn-In magnetic shape-memory Heusler alloys exhibit generally a large thermal hysteresis at their first-order martensitic phase transition which hinder a technological applicatio…