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General Electric (India)

India

5 papers here278 citations across 5
fields
  • cs.CV2
  • cs.LG2
  • eess.SY1
ROR 04dd9ss52OpenAlex

affiliations via OpenAlex

output
20122021
most citedMaking Risk Minimization Tolerant to Label Noise

224 citations

researchers with a paper here

Counting papers with at most 25 authors, so collaboration author lists do not stand in for the people here.

  • Naresh Manwani2 · h 12
  • P. Sastry2 · h 31
  • Aritra Ghosh1 · h 9
  • Etika Agarwal1 · h 7
  • Hariharan Ravishankar1 · h 11
  • Le Xie1 · h 50
  • Navchetan Awasthi1 · h 12
  • N.Hari Babu1 · h 1
  • P. Antsaklis1 · h 73
  • Pavan Annangi1 · h 8
  • Prasad Sudhakar1 · h 8
  • Rahul Venkataramani1 · h 7
collaborating institutions
  • Indian Institute of Science BangaloreIN3 papers
  • GE Global Research (United States)US1 paper
  • Harvard University PressUS1 paper
  • Massachusetts General HospitalUS1 paper
  • Texas A&M UniversityUS1 paper
  • University of Notre DameUS1 paper
Showing 2014Show all

1 paper · 1 filter

cs.LG2014★ 224 cited

Making Risk Minimization Tolerant to Label Noise

Aritra Ghosh, Naresh Manwani, P. S. Sastry

In many applications, the training data, from which one needs to learn a classifier, is corrupted with label noise. Many standard algorithms such as SVM perform poorly in presence…

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