544 citations
Counting papers with at most 25 authors, so collaboration author lists do not stand in for the people here.
- Intel (United States)US7 papers
- University College CorkIE3 papers
- University College DublinIE2 papers
- Association of Electronic and Information TechnologiesES1 paper
- Barcelona Supercomputing CenterES1 paper
- Berlin Institute for the Foundations of Learning and DataDE1 paper
- BOKU UniversityAT1 paper
- Dublin City UniversityIE1 paper
- Fraunhofer Institute for Telecommunications, Heinrich Hertz InstituteDE1 paper
- Free University of Bozen-BolzanoIT1 paper
- Imperial College LondonGB1 paper
- Institut national de recherche en sciences et technologies du numériqueFR1 paper
3 papers · 1 filter
Effect of strain, thickness, and local surface environment on electron transport properties of oxygen-terminated copper thin films
Alfonso Sanchez-Soares, Sarah L. T. Jones, John J. Plombon +4
Electron transport is studied in surface oxidized single-crystal copper thin films with a thickness of up to 5.6 nm by applying density functional theory and density functional tig…
Electron transport properties of sub-3-nm diameter copper nanowires
Sarah L. T. Jones, Alfonso Sanchez-Soares, John J. Plombon +4
Density functional theory and density functional tight-binding are applied to model electron transport in copper nanowires of approximately 1 nm and 3 nm diameters with varying cry…
First Principle-based Analysis of Single-Walled Carbon Nanotube and Silicon Nanowire Junctionless Transistors
Lida Ansari, Baruch Feldman, Giorgos Fagas +5
Junctionless transistors made of silicon have previously been demonstrated experimentally and by simulations. Junctionless devices do not require fabricating an abrupt source-drain…