32 citations
- Centre National de la Recherche ScientifiqueFR3 papers
- Institut d'électronique de microélectronique et de nanotechnologieFR2 papers
- Weizmann Institute of ScienceIL2 papers
- Institut Charles Gerhardt MontpellierFR1 paper
- Institut de ChimieFR1 paper
- Kerntechnische Entsorgung Karlsruhe (Germany)DE1 paper
- Technion – Israel Institute of TechnologyIL1 paper
- Technische Universität DresdenDE1 paper
- Université de MontpellierFR1 paper
- UNSW SydneyAU1 paper
4 papers
Sparsity-Based Super Resolution for SEM Images
Shahar Tsiper, Or Dicker, Idan Kaizerman +3
The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emi…
Structural Contribution to the Ferroelectric Fatigue in Lead Zirconate Titanate (PZT) Ceramics
Manuel Hinterstein, Jerome Rouquette, J. Haines +5
Many ferroelectric devices are based on doped lead zirconate titanate (PZT) ceramics with compositions near the morphotropic phase boundary (MPB), at which the relevant material's…
1/f Tunnel Current Noise through Si-bound Alkyl Monolayers
Nicolas Clément, Stéphane Pleutin, Oliver Seitz +2
We report low frequency tunnel current noise characteristics of an organic monolayer tunnel junction. The measured devices, n-Si/alkyl chain (C18H37)/Al junctions, exhibit a clear…
1/f Tunnel Current Noise through Si-bound Alkyl Monolayers
Nicolas Clement, Stephane Pleutin, Oliver Seitz +2
We report low frequency tunnel current noise characteristics of an organic monolayer tunnel junction. The measured devices, n-Si/alkyl chain (C18H37)/Al junctions, exhibit a clear…