21 citations · 45 across the 8 of their papers we have counts for
4 papers · 1 filter
Enhanced low-flux sensitivity (ELFS) effect of neutron-induced displacement damage in bipolar devices: physical mechanism and parametric model
Yang Liu, Ying Zhang, Mu Lan +2
Similar to the enhanced low-dose-rate sensitivity (ELDRS) effect of ionization damage, an enhanced low-flux senstivity (ELFS) effect has been reported in ions/neutron irradiation o…
Ultra-Slow Dynamic Annealing of Neutron-induced Defects in n-type Silicon: Role of Charge Carriers
Ying Zhang, Yang Liu, Hang Zhou +3
Neutron bombardments with equivalent fluence (110 cm) and different fluxes (10 cms to 10 cms) have bee…
Mechanism of Synergistic Effects of Neutron- and Gamma-Ray-Radiated PNP Bipolar Transistors
Yu Song, Ying Zhang, Yang Liu +6
The synergistic effects of neutron and gamma ray radiated PNP transistors are systematically investigated as functions of the neutron fluence, gamma ray dose, and dose rate. We fin…
Linear Dependence of Post-irradiation Input Bias Currents on Pre-irradiation Values in Silicon Bipolar Microcircuits
Yu Song, Jie Zhao, Shun Li +7
We find in experiments a linear dependence of ionization irradiation-induced degradations on pre-irradiation values of the input bias current in bipolar devices with simple input s…