J. Cottom

most citedElectrically detected magnetic resonance of carbon dangling bonds at the Si-face 4H-SiC/SiO

_{2}

interface

30 citations · 30 across the 1 of their papers we have counts for

collaborators

2 papers

cond-mat.mtrl-sci2018

The origin of negative charging in amorphous Al $_{2}$ O $_{3}$ films: The role of native defects

Oliver A. Dicks, Jonathon Cottom, Alexander L. Shluger +1

Amorphous aluminum oxide Al $_{2}$ O $_{3}$ (a-Al $_{2}$ O $_{3}$ ) layers grown by various deposition techniques contain a significant density of negative charges. In spite of several experiment…

cond-mat.mtrl-sci2017★ 30 cited

Electrically detected magnetic resonance of carbon dangling bonds at the Si-face 4H-SiC/SiO $_{2}$ interface

Gernot Gruber, Jonathon Cottom, Robert Meszaros +5

SiC based metal-oxide-semiconductor field-effect transistors (MOSFETs) have gained a significant importance in power electronics applications. However, electrically active defects…

The origin of negative charging in amorphous Al2​O3​ films: The role of native defects

Electrically detected magnetic resonance of carbon dangling bonds at the Si-face 4H-SiC/SiO2​ interface

The origin of negative charging in amorphous Al $_{2}$ O $_{3}$ films: The role of native defects

Electrically detected magnetic resonance of carbon dangling bonds at the Si-face 4H-SiC/SiO $_{2}$ interface