most citedOn-the-fly Data Assessment for High Throughput X-ray Diffraction Measurement

23 citations · 23 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2017★ 23 cited

On-the-fly Data Assessment for High Throughput X-ray Diffraction Measurement

Fang Ren, Ronald Pandolfi, Douglas Van Campen +2

Investment in brighter sources and larger and faster detectors has accelerated the speed of data acquisition at national user facilities. The accelerated data acquisition offers ma…