2 papers
cond-mat.mtrl-sci2020
Computer-readable Image Markers for Automated Registration in Correlative Microscopy autoCRIM
J. Sheriff, I. W. Fletcher, P. J. Cumpson
We present a newly developed methodology using computer-readable fiducial markers to allow images from multiple imaging modalities to be registered automatically. This methodology…
physics.app-ph2017
Argon Cluster-Ion Sputter Yield: Molecular Dynamics Simulations on Silicon and an Equation for Estimating Total Sputter Yield
Peter J Cumpson, Mieszko Jaskiewicz, WooKyun Kim
Argon Gas Cluster-Ion Beam sources have become widely-used on x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) instruments in recent years, but the…