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cond-mat.mtrl-sci2017★ 7 cited
X-ray diffraction line profile analysis of KBr thin films
R. Rai, Triloki, B. K. Singh
In the present work, the microcrystalline characteristics of KBr thin films have been investigated by evaluating the breadth of diffraction peak. The Williamson-Hall, the Size-Stra…
cond-mat.mtrl-sci2012
Structural characterization of as-deposited cesium iodide films studied by X-ray diffraction and transmission electron microscopy techniques
Triloki, P. Garg, R. Rai +1
In the present work, cesium iodide (CsI) thin films of different thickness have been prepared by thermal evaporation technique. The crystallite size and grain size of these films a…