115 citations · 249 across the 9 of their papers we have counts for
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X-ray phase contrast topography to measure the surface stress and bulk strain in a silicon crystal
Enrico Massa, Carlo Paolo Sasso, Matteo Fretto +2
The measurement of the Si lattice parameter by x-ray interferometry assumes the use of strain-free crystals, which might not be true because of intrinsic stresses due to surface re…
Self-organizing memristive nanowire networks with structural plasticity emulate biological neuronal circuits
Gianluca Milano, Giacomo Pedretti, Matteo Fretto +5
Acting as artificial synapses, two-terminal memristive devices are considered fundamental building blocks for the realization of artificial neural networks. Organized into large ar…
Substrate induced proximity effect in superconducting niobium nanofilms
S. J. Rezvani, A. Perali, M. Fretto +5
Structural and superconducting properties of high quality Niobium nanofilms with different thicknesses are investigated on silicon oxide and sapphire substrates. The role played by…