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cond-mat.mtrl-sci2020
Multibeam Electron Diffraction
Xuhao Hong, Steven E Zeltmann, Benjamin H Savitzky +5
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam e…
cond-mat.mtrl-sci2020
4D-STEM elastic stress state characterisation of a TWIP steel nanotwin
T P McAuliffe, A K Ackerman, B H Savitzky +4
We measure the stress state in and around a deformation nanotwin in a twinning-induced plasticity (TWIP) steel. Using four-dimensional scanning transmission electron microscopy (4D…