14 citations · 34 across the 10 of their papers we have counts for
Showing 2017 · cond-mat.mes-hallShow all
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cond-mat.mes-hall2017★ 3 cited
Vector Electric Field Measurement via Position-Modulated Kelvin Probe Force Microscopy
Ryan P. Dwyer, Louisa M. Smieska, Ali Moeed Tirmzi +1
High-quality spatially-resolved measurements of electric fields are critical to understanding charge injection, charge transport, and charge trapping in semiconducting materials. H…
cond-mat.mes-hall2017
Cryogenic positioning and alignment with micrometer precision
Corinne E. Isaac, Elizabeth A. Curley, Pamela T. Nasr +2
Aligning a microcantilever to an area of interest on a sample is a critical step in many scanning probe microscopy experiments, particularly those carried out on devices and rare,…