Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa${}_2$Cu${}_3$O${}_{7-\delta }$ thin films

Nicolas Gauquelin, Hao Zhang, Guozhen Zhu +2

We have discovered two novel types of planar defects that appear in heteroepitaxial YBa${}_2$Cu${}_3$O${}_{7-\delta }$ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with…