259 citations · 467 across the 12 of their papers we have counts for
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cond-mat.dis-nn2012★ 24 cited
Universal dielectric loss in amorphous solids from simultaneous bias and microwave field
Alexander L. Burin, Moe S. Khalil, Kevin D. Osborn
We derive the ac dielectric loss in glasses due to resonant processes created by two-level systems and a swept electric field bias. It is shown that at sufficiently large ac fields…
cond-mat.supr-con2012★ 26 cited
A Josephson junction defect spectrometer for measuring two-level systems
M. J. A. Stoutimore, M. S. Khalil, C. J. Lobb +1
We have fabricated and measured Josephson junction defect spectrometers (JJDSs), which are frequency-tunable, nearly-harmonic oscillators that probe strongly-coupled two-level syst…