most citedRapid characterization of wafer-scale 2D material: Epitaxial graphene and graphene nanoribbons on SiC

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physics.app-ph2018

Confocal laser scanning microscopy: A tool for rapid optical characterization of 2D materials

Vishal Panchal, Yanfei Yang, Guangjun Cheng +9

Confocal laser scanning microscopy (CLSM) is a non-destructive, highly-efficient optical characterization method for large-area analysis of graphene on different substrates, which…

physics.app-ph2017★ 3 cited

Rapid characterization of wafer-scale 2D material: Epitaxial graphene and graphene nanoribbons on SiC

Vishal Panchal, Yanfei Yang, Guangjun Cheng +8

We demonstrate that the confocal laser scanning microscopy (CLSM) provides a non-destructive, highly-efficient characterization method for large-area epitaxial graphene and graphen…