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cond-mat.mtrl-sci2004
Condensation and sublimation of thin amorphous arsenic films studied by ellipsometr
Andrey V. Vasev, Sergey I. Chikichev
From in-situ ellipsometric measurements during condensation of As4 molecular beam on GaAs(001) substrate the arsenic sticking coefficient was determined. For the substrate with Ga-…
cond-mat.mtrl-sci2004★ 3 cited
Ellipsometric detection of transitional surface structures on decapped GaAs(001)
Andrey V. Vasev, Sergey I. Chikichev
Structural and optical properties of MBE-grown GaAs(001) surface have been studied by reflection high-energy electron diffraction and single-wavelength ellipsometry under dynamic c…