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cond-mat.mtrl-sci2018★ 246 cited
Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2
Yue Niu, Sergio Gonzalez-Abad, Riccardo Frisenda +12
The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their numbe…
cond-mat.mtrl-sci2018
Biaxial strain in atomically thin transition metal dichalcogenides
Riccardo Frisenda, Robert Schmidt, Steffen Michaelis de Vasconcellos +3
Strain engineering in single-layer semiconducting transition metal dichalcogenides aims to tune their bandgap energy and to modify their optoelectronic properties by the applicatio…