1 citations · 1 across the 3 of their papers we have counts for
3 papers
Interfacial Atomic Number Contrast in Thick TEM Samples
Aniruddha Dutta, Helge Heinrich
The atomic number contrast imaging technique reveals an increase in intensity at interfaces of a high and low-density material in case of relatively thick samples. Elastic scatteri…
Nano-scale characterization of the formation of silver layers during electroless deposition on polymeric surfaces
Aniruddha Dutta, Biao Yuan, Helge Heinrich +3
We report here a quantitative method of Transmission Electron Microscopy (TEM) to measure the shapes, sizes and volumes of nanoparticles which are responsible for their properties.…
Structural, Optical and Electronic properties of Magnetron Sputtered Si and Ge thin films
Aniruddha Dutta, Shilpa Tripathi, Ranjeet Kumar Brajpuriya +2
We report the results of GIXRR, UV-VIS NIR and XPS measurements on Si and Ge thin films of various thicknesses. While GIXRR measurements show no presence of oxide on the top of the…