activity
20132023
most citedDirect Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

672 citations · 1.3k across the 13 of their papers we have counts for

collaborators

13 papers

cond-mat.mtrl-sci2023★ 2 cited

X-ray diffraction study of epitaxial CuO nanostructures obtained through post-deposition annealing of Cu on SrTiO(001)

Maurizio de Santis, Veronique Langlais, Lucio Martinelli +3

Orientation, structure and morphology in the early growth stages of CuO films on strontium titanate were studied by synchrotron radiation X-ray diffraction. Nanostructured CuO film…

cond-mat.mes-hall2022★ 13 cited

Evidence of localization effect on photoelectron transport induced by alloy disorder in nitride semiconductor compounds

Mylène Sauty, Nicolas M. S. Lopes, Jean-Philippe Banon +7

Near-bandgap photoemission spectroscopy experiments were performed on p-GaN and p-InGaN/GaN photocathodes activated to negative electron affinity. The photoemission quantum yield o…

cond-mat.mes-hall2020★ 33 cited

Evidence for trap-assisted Auger recombination in MBE grown InGaN quantum wells by electron emission spectroscopy

Daniel Myers, Andrew Espenlaub, Kristina Gelzinyte +5

We report on the direct measurement of hot electrons generated in the active region of blue light-emitting diodes grown by ammonia molecular beam epitaxy by electron emission spect…

cond-mat.mtrl-sci2019★ 1 cited

Spin- and angle-resolved photoemission studies of the electronic structure of Si(110)"16x2" surfaces

N. K. Lewis, Y. Lassailly, L. Martinelli +8

The electronic structure of Si(110)"16 x 2" double-domain, single-domain and 1 x 1 surfaces have been investigated using spin- and angle-resolved photoemission at sample temperatur…

cond-mat.mes-hall2018★ 6 cited

Mechanical stress dependence of the Fermi level pinning on an oxidized silicon surface

H. Li, L. Martinelli, F. Cadiz +4

A combination of micro-Raman spectroscopy and micro-XPS (X-ray photo-electron spectroscopy) mapping on statically deflected p-type silicon cantilevers is used to study the mechanic…

cond-mat.mes-hall2018★ 45 cited

Evidence of nanoscale Anderson localization induced by intrinsic compositional disorder in InGaN/GaN quantum wells by scanning tunneling luminescence spectroscopy

W. Hahn, J. -M. Lentali, P. Polovodov +11

We present direct experimental evidences of Anderson localization induced by the intrinsic alloy compositional disorder of InGaN/GaN quantum wells. Our approach relies on the measu…