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cond-mat.mtrl-sci2020
Local electronic transport across probe/ionic conductor interface in scanning probe microscopy
K. N. Romanuk, D. O. Alikin, B. N. Slautin +3
Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurem…
cond-mat.mtrl-sci2019
Polarization-dependent conductivity of grain boundaries in BiFeO3 thin films
Denis Alikin, Yevhen Fomichov, Saulo Portes Reis +7
Charge transport across the interfaces in complex oxides attracts a lot of attention because it allows creating novel functionalities useful for device applications. In particular,…