3 papers
eess.SY2025
Cross-Process Defect Attribution using Potential Loss Analysis
Tsuyoshi Idé, Kohei Miyaguchi
Cross-process root-cause analysis of wafer defects is among the most critical yet challenging tasks in semiconductor manufacturing due to the heterogeneity and combinatorial nature…
cs.LG2024
Black-Box Anomaly Attribution
Tsuyoshi Idé, Naoki Abe
When the prediction of a black-box machine learning model deviates from the true observation, what can be said about the reason behind that deviation? This is a fundamental and ubi…
cs.LG2024
Improving Transformers using Faithful Positional Encoding
Tsuyoshi Idé, Jokin Labaien, Pin-Yu Chen
We propose a new positional encoding method for a neural network architecture called the Transformer. Unlike the standard sinusoidal positional encoding, our approach is based on s…