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cond-mat.mtrl-sci2024
Stacking fault segregation imaging with analytical field ion microscopy
F. F. Morgado, L. T. Stephenson, S. Bhatt +8
Stacking faults (SF) are important structural defects that play an essential role in the deformation of engineering alloys. However, direct observation of stacking faults at the at…
cond-mat.mtrl-sci2024★ 1 cited
Understanding atom probe's analytical performance for iron oxides using correlation histograms and ab initio calculations
Se-Ho Kim, Shalini Bhatt, Daniel K. Schreiber +4
Field evaporation from ionic or covalently bonded materials often leads to the emission of molecular ions. The metastability of these molecular ions, particularly under the influen…