2 papers
cs.CV2021
Synthetic training data generation for deep learning based quality inspection
Pierre Gutierrez, Maria Luschkova, Antoine Cordier +3
Deep learning is now the gold standard in computer vision-based quality inspection systems. In order to detect defects, supervised learning is often utilized, but necessitates a la…
cs.CV2018
How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?
Patrick Trampert, Faysal Bourghorbel, Pavel Potocek +4
In scanning electron microscopy, the achievable image quality is often limited by a maximum feasible acquisition time per dataset. Particularly with regard to three-dimensional or…