9 citations · 18 across the 4 of their papers we have counts for
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cond-mat.mtrl-sci2013★ 1 cited
Influence of homo-buffer layer on stress control of sputtered (Ba0.45,Sr0.55)TiO3 thin films on Pt-Si
Y. K. Vayunandana Reddy, Guillaume Guegan, Mohamed Lamhamdi +2
To engineer strain relaxation of sputtered BST thin films on Pt-Si wafers, homo-buffer layer method was applied to eliminate Pt hillock formation. Thin BST homo-buffer layers were…
cond-mat.mtrl-sci2012
Polaron relaxation in ferroelectric thin films
E. Arveux, D. Levasseur, A. Rousseau +3
We report a dielectric relaxation in ferroelectric thin films of the ABO3 family. We have compared films of different compositions with several growth modes: sputtering (with and w…