430 citations · 1.2k across the 64 of their papers we have counts for
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Building and exploring libraries of atomic defects in graphene: scanning transmission electron and scanning tunneling microscopy study
Maxim Ziatdinov, Ondrej Dyck, Bobby G. Sumpter +3
Population and distribution of defects is one of the primary parameters controlling materials functionality, are often non-ergodic and strongly dependent on synthesis history, and…
Learning from imperfections: constructing phase diagrams from atomic imaging of fluctuations
Lukas Vlcek, Maxim A. Ziatdinov, Alexander Tselev +3
Materials characterization and property measurements are a cornerstone of material science, providing feedback from synthesis to applications. Traditionally, a single sample is use…
Deep Learning Analysis of Defect and Phase Evolution During Electron Beam Induced Transformations in WS2
Artem Maksov, Ondrej Dyck, Kai Wang +7
Understanding elementary mechanisms behind solid-state phase transformations and reactions is the key to optimizing desired functional properties of many technologically relevant m…
Mapping mesoscopic phase evolution during e-beam induced transformations via deep learning of atomically resolved images
Rama K. Vasudevan, Nouamane Laanait, Erik M. Ferragut +7
Understanding transformations under electron beam irradiation requires mapping the structural phases and their evolution in real time. To date, this has mostly been a manual endeav…
Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations
Maxim Ziatdinov, Ondrej Dyck, Artem Maksov +7
Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various func…
Deep analytics of atomically-resolved images: manifest and latent features
Maxim Ziatdinov, Ondrej Dyck, Artem Maksov +7
Recent advances in scanning transmission electron and scanning tunneling microscopies allow researchers to measure materials structural and electronic properties, such as atomic di…