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physics.app-ph2018
Modeling and Simulation of Electromigration Behavior for Via Array Structure
Karthik Airani, Rohit Guttal
In this paper, we develop a analytical model and algorithm for calculating uneven current distribution in via array structures. We propose a stress time translation formula and cum…
physics.app-ph2017
Uneven Current Distribution Modeling and Random Walk based Variation Analysis for interconnect Electromigration Estimation
Karthik Airani, Rohit Guttal
In this paper, we modeled and simulated uneven current distribution for on-die interconnect structure. We show significant difference when considering uneven current distribution.…
physics.app-ph2017
Chip-Level Electromigration Reliability Evaluation with Multiple On-Die Variation Effects
Karthik Airani, Rohit Guttal
In this paper, we briefly introduce physical foundations of electromigration (EM) and present a few classical EMrelated theories. We discuss physical parameters affecting EM wire l…