2 papers
nucl-ex2025
Measurement of production branching ratio after muon nuclear capture reaction of Al and Si isotopes
R. Mizuno, M. Niikura, T. Y. Saito +18
Background: Muon nuclear capture is a reaction between a muon and a proton inside a nucleus through weak interactions. This reaction results in the formation of an excited nucleus,…
physics.ins-det2025
A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement
Yuibi Gomi, Akira Sato, Waleed Madany +4
We developed a 55 nm CMOS SRAM chip that scans all data every 125 ns and outputs timestamped soft error data via an SPI interface through a FIFO. The proposed system, consisting of…