2 papers
stat.AP2026
Hierarchical Spline-Based Bayesian Beta-Binomial Regression for Estimating Time-Varying Risk in Power Outages
Justin Jacobs, Jesse Piburn, Aaron Myers
We propose a hierarchical Bayesian model for estimating time-varying outage risk from county-level power outage data. The model combines cubic B-spline basis functions with a Beta-…
cond-mat.mtrl-sci2026
Scaling Two-Dimensional Semiconductor Nanoribbons for High-Performance Electronics
Hao-Yu Lan, Shao-Heng Yang, Yongjae Cho +10
As silicon transistors scale toward future technology nodes, three-dimensional architectures -- including gate-all-around (GAA) nanoribbon and complementary field-effect transistor…