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20042016
most citedRobustness of a topological phase: Topological color code in parallel magnetic field

35 citations · 149 across the 15 of their papers we have counts for

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Showing cond-mat.mtrl-sciShow all

9 papers · 1 filter

cond-mat.mtrl-sci2012

One directional Polarized Neutron Reflectometry with optimized reference layer method

Seyed Farhad Masoudi, Saeed S. Jahromi

In the past decade, several neutron reflectometry methods for determining the modulus and phase of the complex reflection coefficient of an unknown multilayer thin film have been w…

cond-mat.mtrl-sci2012

Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by neutron reflectometry

S. S. Jahromi, S. F. Masoudi

Most of the reflectometry methods which are used for determining the phase of complex reflection coefficient such as reference method and Variation of Surroundings medium are based…

cond-mat.mtrl-sci2011★ 1 cited

Polarized Neutron Reflectometry at the Presence of Smooth Interfacial Potential

Saeed S. Jahromi, Seyed Farhad Masoudi

Polarized neutron reflectometry (PNR) have developed theoretically and experimentally in the past decades. In order to resolve the phase problem in neutron reflectometry, several s…

cond-mat.mtrl-sci2011

Detection of nano scale thin films with polarized neutron reflectometry at the presence of smooth and rough interfaces

Saeed S. Jahromi, Seyed Farhad Masoudi

By knowing the phase and modules of the reflection coefficient in neutron reflectometry problems, a unique result for the scattering length density (SLD) of a thin film can be dete…

cond-mat.mtrl-sci2011★ 1 cited

Retrieval of depth profile of nano scale thin films by one directional polarization analysis in neutron specular reflectometry

S. Farhad Masoudi, Saeed S. Jahromi

Recently it has been shown that the modules and phase of complex reflection coefficient can be determined by using a magnetic substrate and polarized neutrons. Several other method…

cond-mat.mtrl-sci2004★ 5 cited

Phase determination in spin-polarized neutron specular reflectometry by using a magnetic substrate

S. Farhad Masoudi

The scattering length density profile for a thin film structure can be determined uniquely if both modulus and phase of the reflection coefficient is known. Here, we describe a met…

cond-mat.mtrl-sci2004★ 7 cited

Retrieval of the reflection coefficient in neutron specular reflectometry

S. F. Masoudi, A. Pazirandeh

A method is proposed which allows a complete determination of the complex reflection coefficient for any free unknown real potential (i.e., in the case where there is no effective…

cond-mat.mtrl-sci2004

Influences of substrate thickness on neutron specular reflection

S. F. Masoudi

In specular reflection experiments the reflected beam from the end side of thick substrates is typically neglected. This is equivalent to assuming the substrates as semi-infinite m…

cond-mat.mtrl-sci2004

Effect of backing thickness on determination of the phase in neutron reflectometry by variation of backing

S. F. Masoudi, A. Pazirandeh, G. R. Jafari

The determination of density profiles with knowing the phase information of complex reflection coefficient for neutron specularly reflected from a film, yields unique results. Rece…