7 papers
On Transmission Function Amplitude and Phase Recovery in Multislice Electron Ptychography
Bridget R. Denzer, Colin Gilgenbach, James M. LeBeau
{Multislice electron ptychography commonly accounts for inelastic scattering by including an absorptive object potential in the reconstruction forward model that attenuates the ela…
Operando Electron Microscopy of Nanoscale Electronic Devices on Non-Conductive Substrates
Menglin Zhu, Michael Xu, Zishen Tian +7
Achieving operating conditions comparable to ``bulk'' electronic devices, such as thin film capacitors, during \textit{operando} electron microscopy remains challenging, particular…
phaser: A unified and extensible framework for fast electron ptychography
Colin Gilgenbach, Menglin Zhu, James M. LeBeau
We present \code{phaser}, an open-source Python package that provides a unified interface to both conventional and gradient descent-based ptychographic algorithms. Features such as…
Optimizing Atomic Number Contrast in Multislice Electron Ptychography
Bridget R. Denzer, Colin Gilgenbach, James M. LeBeau
Here we explore the atomic number () dependence of multislice electron ptychography and approaches to optimize Z sensitivity. Specifically, we show that ptychography's -depen…
Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC
Aaditya Bhat, Colin Gilgenbach, Junghwa Kim +3
Here, we evaluate multislice electron ptychography as a tool to carry out depth-resolved atomic resolution characterization of point defects, using silicon carbide as a case study.…
Grain Boundary Space Charge Engineering of Solid Oxide Electrolytes: Model Thin Film Study
Thomas Defferriere, Yong Beom Kim, Colin Gilgenbach +3
Grain boundaries (GB) profoundly influence the electrical properties of polycrystalline ionic solids. Yet, precise control of their transport characteristics has remained elusive,…