50 citations · 62 across the 7 of their papers we have counts for
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Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang +6
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration co…
Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang +6
Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despi…
Towards construction of a novel nm resolution MeV-STEM for imaging of thick biological samples
X. Yang, L. Wang, J. Maxson +11
Driven by life-science applications, mega-electron-volt Scanning Transmission Electron Microscope (MeV-STEM) has been proposed to image thick biological samples. The high penetrati…