2 papers
cs.CV2025
Physics Informed Generative Models for Magnetic Field Images
Aye Phyu Phyu Aung, Lucas Lum, Zhansen Shi +5
In semiconductor manufacturing, defect detection and localization are critical to ensuring product quality and yield. While X-ray imaging is a reliable non-destructive testing meth…
physics.ins-det2025
A Spatial-Physics Informed Model for 3D Spiral Sample Scanned by SQUID Microscopy
J. Senthilnath, Jayasanker Jayabalan, Zhuoyi Lin +5
The development of advanced packaging is essential in the semiconductor manufacturing industry. However, non-destructive testing (NDT) of advanced packaging becomes increasingly ch…