2 papers
physics.ins-det2025
afspm: A Framework for Manufacturer-Agnostic Automation in Scanning Probe Microscopy
Nicholas J. Sullivan, Julio J. Valdés, Kirk H. Bevan +1
Scanning probe microscopy (SPM) is a valuable technique by which one can investigate the physical characteristics of the surfaces of materials. However, its widespread use is hampe…
cond-mat.mes-hall2025
Probing Electrocatalytic Gas Evolution Reaction at Pt by Force Noise Measurements. Part 1-Hydrogen
Nataraju Bodappa, Zixiao Zhang, Ramin Yazdaanpanah +4
Electrocatalytic processes occurring at the heterogeneous interface are complex and their understanding at the molecular level remains challenging. Atomic force microscope (AFM) ca…