2 papers
physics.ins-det2025
afspm: A Framework for Manufacturer-Agnostic Automation in Scanning Probe Microscopy
Nicholas J. Sullivan, Julio J. Valdés, Kirk H. Bevan +1
Scanning probe microscopy (SPM) is a valuable technique by which one can investigate the physical characteristics of the surfaces of materials. However, its widespread use is hampe…
cond-mat.mtrl-sci2025
Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO
Adam J. Czarnecki, Nikola L. Kolev, Patrick See +5
As silicon-based devices continue to shrink to the nanoscale, traps at the Si-SiO interface pose increasing challenges to device performance. These traps reduce channel carrier…