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D. Haviland

60 papers hereh-index 333.9k citations200 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author1
  • middle author12
  • last author46

Across the 59 of 60 papers where every author was matched, so the position is known.

fields
  • cond-mat.mes-hall36
  • quant-ph12
  • cond-mat.supr-con4
  • physics.ins-det3
  • cond-mat.other2
  • physics.app-ph2

identity via Semantic Scholar / OpenAlex

activity
19972026
most citedA virtual instrument to standardise the calibration of atomic force microscope cantilevers

156 citations · 1.2k across the 60 of their papers we have counts for

collaborators
Showing 2014Show all

3 papers · 1 filter

cond-mat.mes-hall2014★ 47 cited

Intermodulation electrostatic force microscopy for imaging surface photo-voltage

Riccardo Borgani, Daniel Forchheimer, Jonas Bergqvist +3

We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic…

cond-mat.mes-hall2014★ 18 cited

Determining surface properties with bimodal and multimodal AFM

Daniel Forchheimer, Stanislav S. Borysov, Daniel Platz +1

Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequen…

physics.ins-det2014★ 7 cited

Dynamic Calibration of Higher Eigenmode Parameters of a Cantilever in Atomic Force Microscopy Using Tip-Surface Interactions

Stanislav S. Borysov, Daniel Forchheimer, David B. Haviland

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on…

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