2 papers
cond-mat.mtrl-sci2025
Improving atomic force microscopy structure discovery via style-translation
Jie Huang, Niko Oinonen, Fabio Priante +4
Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM…
cond-mat.mtrl-sci2025
Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
Utkarsh Pratiush, Austin Houston, Kamyar Barakati +70
Microscopy is a primary source of information on materials structure and functionality at nanometer and atomic scales. The data generated is often well-structured, enriched with me…